Material Characterisation Equipment
SEM/EDS Analysis System
Integrated SEM and EDS for morphology and elemental analysis
PRODUCT OVERVIEW
An integrated scanning electron microscope and energy dispersive X-ray spectroscopy system for simultaneous morphological imaging and elemental analysis. Essential for failure analysis, materials research, and quality control.
TECHNICAL SPECIFICATIONS
SEM Resolution1.0nm at 15kV
EDS DetectorSilicon drift detector, 80mm²
Energy Resolution<127eV at Mn Kα
Elemental RangeBe to Pu
MappingElemental mapping and line scan
SoftwareQuantitative analysis and reporting
APPLICATIONS
- Failure analysis
- Coating characterisation
- Inclusion identification
- Particle analysis
- Elemental mapping
KEY FEATURES
- Simultaneous imaging and elemental analysis
- High-sensitivity SDD detector
- Quantitative elemental analysis
- Elemental mapping for phase distribution
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Electron Microscopy & Spectroscopy