Product Category

Research & Development Equipment

Advanced analytical and characterisation instruments for materials research — scanning electron microscopes, X-ray diffractometers, DSC, AFM, and TGA systems.

Scanning Electron Microscope (SEM)

High-resolution scanning electron microscope for surface morphology and elemental analysis.

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X-Ray Diffractometer (XRD)

Benchtop X-ray diffractometer for phase identification and crystal structure analysis.

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Differential Scanning Calorimeter (DSC)

Differential scanning calorimeter for thermal analysis of phase transitions, melting, and crystallisation.

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Atomic Force Microscope (AFM)

Atomic force microscope for nanoscale surface topography and mechanical property mapping.

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Thermogravimetric Analyser (TGA)

Thermogravimetric analyser for mass change measurement during controlled heating or isothermal conditions.

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