Material Characterisation Equipment
X-Ray Diffraction Analyzer
Phase identification and crystal structure analysis
PRODUCT OVERVIEW
An X-ray diffraction analyser for phase identification, crystal structure determination, residual stress measurement, and texture analysis. Provides definitive phase identification from powder and bulk specimens.
TECHNICAL SPECIFICATIONS
X-Ray SourceCu Kα, Co Kα, Mo Kα
DetectorPosition-sensitive detector
2θ Range5° to 160°
Angular Resolution0.01°
DatabaseICDD PDF-4+ compatible
SoftwarePhase ID, Rietveld refinement
APPLICATIONS
- Phase identification
- Residual stress measurement
- Crystal structure determination
- Retained austenite measurement
- Texture and preferred orientation
KEY FEATURES
- Definitive phase identification
- Residual stress measurement capability
- Rietveld refinement for quantitative phase analysis
- Comprehensive reference database
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Electron Microscopy & Spectroscopy