Scientific & Research Microscopes
Atomic Force Microscope
Atomic-scale surface topography and property mapping
PRODUCT OVERVIEW
An atomic force microscope for nanometre and sub-nanometre surface topography measurement. Provides quantitative surface roughness, mechanical properties, and electrical characterisation at the nanoscale.
TECHNICAL SPECIFICATIONS
Z-Resolution<0.1nm
XY Resolution<1nm
Scan RangeUp to 100×100µm
ModesContact, tapping, non-contact, PFM, KPFM
EnvironmentAir, liquid, controlled atmosphere
SoftwareSPM data analysis suite
APPLICATIONS
- Surface roughness measurement
- Thin film characterisation
- Polymer surface analysis
- Nanoparticle characterisation
- Biological membrane imaging
KEY FEATURES
- Sub-nanometre vertical resolution
- Multiple imaging modes for different material properties
- Liquid cell for biological samples
- Comprehensive data analysis software
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Advanced Research Microscopes