Scientific & Research Microscopes
Scanning Electron Microscope (SEM)
Nanoscale surface imaging and elemental analysis
PRODUCT OVERVIEW
A scanning electron microscope providing high-resolution surface imaging at nanometre scale. Combined with EDS detector for elemental analysis and mapping of materials, coatings, and microstructures.
TECHNICAL SPECIFICATIONS
Resolution1.0nm at 15kV (SE)
Accelerating Voltage0.1 to 30kV
Magnification10x to 1,000,000x
EDS DetectorSilicon drift detector (optional)
ChamberLarge specimen chamber
VacuumHigh vacuum, <10⁻⁴ Pa
APPLICATIONS
- Fracture surface analysis
- Coating characterisation
- Particle morphology
- Failure analysis
- Elemental mapping
KEY FEATURES
- Nanometre resolution for fine microstructure imaging
- EDS for elemental identification and mapping
- Large specimen chamber for industrial components
- Multiple imaging modes: SE, BSE, EDS
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Advanced Research Microscopes