Research & Development Equipment
Atomic Force Microscope (AFM)
PRODUCT OVERVIEW
The atomic force microscope (AFM) provides nanometre-resolution surface topography imaging and mechanical property mapping (modulus, adhesion, hardness) in contact, tapping, and non-contact modes. Suitable for metals, polymers, ceramics, and biological samples.
TECHNICAL SPECIFICATIONS
Lateral Resolution< 1 nm
Vertical Resolution< 0.1 nm
Scan Range (XY)Up to 100 µm
Scan Range (Z)Up to 10 µm
ModesContact, Tapping, Non-contact, PeakForce
EnvironmentAmbient / Liquid cell
APPLICATIONS
- Nanoscale surface topography
- Thin film roughness
- Polymer nanostructure
- Biological cell imaging
- Tribology studies
KEY FEATURES
- Sub-nanometre resolution
- Multiple imaging modes
- Mechanical property mapping
- Liquid cell for in-situ studies
- Vibration isolation system
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