Research & Development Equipment
Scanning Electron Microscope (SEM)
PRODUCT OVERVIEW
The scanning electron microscope (SEM) delivers high-resolution surface imaging and elemental analysis (EDS) of metallic, ceramic, polymer, and biological specimens. Variable pressure mode enables examination of non-conductive samples without coating.
TECHNICAL SPECIFICATIONS
Resolution3.0 nm at 30 kV
Accelerating Voltage0.5 – 30 kV
Magnification10× – 300,000×
DetectorsSE, BSE, EDS
Stage5-axis motorised
Vacuum ModeHigh vacuum / Variable pressure
APPLICATIONS
- Fracture surface analysis
- Particle morphology characterisation
- Elemental mapping (EDS)
- Failure analysis
- Coating microstructure
KEY FEATURES
- High-resolution imaging
- Integrated EDS for elemental analysis
- Variable pressure mode
- 5-axis motorised stage
- Advanced image analysis software
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