Research & Development Equipment
X-Ray Diffractometer (XRD)
PRODUCT OVERVIEW
The benchtop X-ray diffractometer (XRD) enables phase identification, quantitative phase analysis, and crystal structure determination of powders, thin films, and bulk materials. Compact design with full analytical capability for research and quality control laboratories.
TECHNICAL SPECIFICATIONS
X-Ray SourceCu Kα (1.5406 Å)
2θ Range5° – 160°
Angular Resolution0.02°
DetectorPosition-sensitive detector
Sample FormsPowder, bulk, thin film
SoftwarePhase identification database
APPLICATIONS
- Phase identification in alloys
- Residual stress measurement
- Thin film characterisation
- Mineralogy and geology
- Pharmaceutical polymorphism
KEY FEATURES
- Compact benchtop design
- Fast position-sensitive detector
- Phase identification software
- Quantitative phase analysis
- Thin film and stress measurement modes
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